Helios Hydra
Helios 5 Hydra UX DualBeam System
The Helios 5 Hydra Plasma Focused Ion Beam (PFIB) Workstation is the fifth generation fully digital, Extreme High Resolution (XHR) Field Emission Scanning Electron Microscope (FE SEM) equipped with a multiple ion species inductively coupled plasma (ICP) focused ion beam (PFIB).
It enables in-situ large area sample preparation and high-resolution imaging and analysis of areas hundreds of microns across to ensure the collection of relevant and representative results.
It provides highest performance site-specific, high-volume material removal for top-down deprocessing, cross-sectioning, chunking, fast characterization of nanometer details and analysis in 2D and 3D, best in class TEM sample preparation and precise micromachining in a laboratory environment.